Practical issues with 3D noise measurements and application to modern infrared sensors

Patrick O'Shea; Stephen Sousk

doi:10.1117/12.604588

12 May 2005 Practical issues with 3D noise measurements and application to modern infrared sensors

Patrick O'Shea, Stephen Sousk

Proceedings Volume 5784, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XVI; (2005) https://doi.org/10.1117/12.604588
Event: Defense and Security, 2005, Orlando, Florida, United States

Abstract

The two most important characteristics of every infrared imaging system are its resolution and its sensitivity. The resolution is limited by the system's Modulation Transfer Function (MTF), which is typically measurable. System sensitivity is limited by noise, which for infrared systems is usually thought of as a Noise Equivalent Temperature Difference (NETD). However, complete characterization of system noise in modern systems requires the 3D-Noise methodology (developed at NVESD), which separates the system noise into 7 orthogonal components including both temporal-varying and fixed-pattern noises. This separation of noise components is particularly relevant and important in characterizing Focal Plane Arrays (FPA), where fixed-pattern noise can dominate. Since fixed-pattern noise cannot be integrated out by post-processing or by the eye, it is more damaging to range performance than temporally-varying noise. While the 3D-Noise methodology is straightforward, there are several important practical considerations that must be accounted for in accurately measuring 3D Noise in the laboratory. This paper describes these practical considerations, the measurement procedures used in the Advanced Sensor Evaluation Facility (ASEF) at NVESD, and their application to characterizing modern and future infrared imaging systems.

Citation Download Citation

Patrick O'Shea and Stephen Sousk "Practical issues with 3D noise measurements and application to modern infrared sensors", Proc. SPIE 5784, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XVI, (12 May 2005); https://doi.org/10.1117/12.604588

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available