Paper
6 December 2006 An examination of industrial objects with the VolumeScope
Anatoly F. Gamaliy, Michael Yu. Zaytsev
Author Affiliations +
Proceedings Volume 5943, X-ray and Neutron Capillary Optics II; 59430H (2006) https://doi.org/10.1117/12.637915
Event: X-ray and Neutron Capillary Optics II, 2004, Zvenigorod, Russian Federation
Abstract
An X-ray equipment with a Kumakhov lens for scanning industrial objects on the base of Compton backscatter is presented. The device was equipped with X-ray tube BSV-25 with linear tungsten anode and focal spot size 0.07 x 2.0 mm2. The tube voltage and power was 60 kV and 270 W respectively. The focal spot of the lens was 0.08 mm in diameter and the lens transmission was 8.6% at the photon energy 30 keV. Obtained images of various technical objects are presented. The minimum scanning step and the spatial resolution of the images were equal to 0.01 mm and 0.05 mm respectively.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Anatoly F. Gamaliy and Michael Yu. Zaytsev "An examination of industrial objects with the VolumeScope", Proc. SPIE 5943, X-ray and Neutron Capillary Optics II, 59430H (6 December 2006); https://doi.org/10.1117/12.637915
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
X-rays

X-ray detectors

Spatial resolution

Scattering

Sensors

Tungsten

Backscatter

RELATED CONTENT

Small pixel x ray hybrid CMOS detectors a candidate...
Proceedings of SPIE (September 09 2019)
Investigation of polycapillary structures transmission
Proceedings of SPIE (July 30 2002)
Crosstalk modeling of a CT detector
Proceedings of SPIE (May 06 2004)
Monte Carlo study of x ray cross talk in a...
Proceedings of SPIE (June 05 2003)
Digital Slot Scan Mammography Using CCDs
Proceedings of SPIE (January 01 1987)

Back to Top