Paper
23 January 2006 Investigation of the III-V oxidation process for the fabrication of sub-micron three dimensional photonic devices
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Abstract
The lateral oxidation of epitaxially grown AlxGa1-xAs layers is investigated in an open-chamber system based on a conventional horizontal tube furnace, and in a closed-chamber system. The oxidation is selective and depends on the Al content, process temperature, and process time. The process is characterized as a function of these parameters. The closed chamber system provides faster oxidation with superior control, repeatability and uniformity of the oxidation extent as compared to the open-chamber system. Based on these investigations of the oxidation reaction, we propose a unique method for realizing 3D photonic crystals in GaAs/AlGaAs-based material.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Kierthi Swaminathan, Janusz Murakowski, Chris Schuetz, Garrett J. Schneider, Bhargav S. Citla, and Dennis W. Prather "Investigation of the III-V oxidation process for the fabrication of sub-micron three dimensional photonic devices", Proc. SPIE 6110, Micromachining Technology for Micro-Optics and Nano-Optics IV, 61100P (23 January 2006); https://doi.org/10.1117/12.647157
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KEYWORDS
Oxidation

Aluminum

Gallium arsenide

Photonic crystals

Etching

Gallium

Chromium

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