Paper
11 January 2007 Noise reduction in electronic speckle pattern interferometry fringes by fourth-order partial differential equations
Wei Lv, Chen Tang, Wenping Wang
Author Affiliations +
Proceedings Volume 6279, 27th International Congress on High-Speed Photography and Photonics; 62790T (2007) https://doi.org/10.1117/12.725109
Event: 27th International congress on High-Speed Photography and Photonics, 2006, Xi'an, China
Abstract
Noise reduction is one of the largest problems and biggest difficulties involved in electronic speckle pattern interferometry (ESPI). Although the second-order PDEs denoising method is a useful tool of noise reduction for the ESPI fringe patterns, its main drawback is that the second-order PDE model does not remove impulse noise, a 3×3 mean window filter is generally needed to improve the fringes. For overcome this main drawback, in this paper we apply the fourth-order PDE denoising model to the computer-simulated and experimentally obtained ESPI fringe, respectively. In both tests, the fourth-order PDE denoising model clearly outperforms the second-order PDE denoising model. Experimental results have confirmed that the fourth-order PDE denoising model is capable of removing noise in ESPI fringe images effectively.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Wei Lv, Chen Tang, and Wenping Wang "Noise reduction in electronic speckle pattern interferometry fringes by fourth-order partial differential equations", Proc. SPIE 6279, 27th International Congress on High-Speed Photography and Photonics, 62790T (11 January 2007); https://doi.org/10.1117/12.725109
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KEYWORDS
Denoising

Fringe analysis

Image filtering

Speckle pattern

Image processing

Interferometry

Partial differential equations

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