The application of ultrasonic phased array system to the inspection of fillet weld of flat plate

Baohua Shan; Hua Wang; Xin Wang; Zhongdong Duan; Jinping Ou

doi:10.1117/12.725803

5 March 2007 The application of ultrasonic phased array system to the inspection of fillet weld of flat plate

Baohua Shan, Hua Wang, Xin Wang, Zhongdong Duan, Jinping Ou

Proceedings Volume 6595, Fundamental Problems of Optoelectronics and Microelectronics III; 659522 (2007) https://doi.org/10.1117/12.725803
Event: Fundamental Problems of Optoelectronics and Microelectronics III, 2006, Harbin, China

Abstract

The ultrasonic phased array inspection imaging system was developed in this paper, which is integrated on the basis of the each module and the exploitation of subsystem, it is made up of computer, ultrasonic circuit system, scanning device, phased array transducer and imaging software. The ultrasonic phased array inspection imaging system has the functions of controlling ultrasonic transmission and reception, controlling sound beam steering and focusing, controlling scanner moving, receiving flaw information and position formation, restructuring flaw image and commenting damage. Experiment was done on the fillet weld block of T shape flat plate with some artifical flaws using the ultrasonic phased array system, the flaws characteristic could be exactly estimated through comparing and analyzing the flaws position in B-scan image and the waveform feature in A-scan curve, and the flaws size could be measured from the image of C-scan and D-scan. Experiment results indicate that the flaws detected by the manual ultrasonic inspection technology could be found over again by the ultrasonic phased array inspection technology, the flaws size measured by the latter is close to the former, the whole trend of development of flaws are factually imaging by the latter.

Citation Download Citation

Baohua Shan, Hua Wang, Xin Wang, Zhongdong Duan, and Jinping Ou "The application of ultrasonic phased array system to the inspection of fillet weld of flat plate", Proc. SPIE 6595, Fundamental Problems of Optoelectronics and Microelectronics III, 659522 (5 March 2007); https://doi.org/10.1117/12.725803

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