Paper
18 June 2007 Stress behavior of ball grid array (BGA) studied by dynamic electronic speckle pattern interferometry (DESPI)
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Abstract
In this study, behavior of ball grid arrays (BGA) under external cycling loading was studied. A loading system for inducing cycling stress to BGA was successfully built. Dynamic electronic speckle pattern interferometry (DESPI) with in-plane sensitivity and Hilbert transform for phase analysis was applied. The cycling deformation of one solder ball was measured continuously. Temporal, whole-field deformation on one solder ball was demonstrated.
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Violeta Dimitrova Madjarova, Satoru Toyooka, Hiroyuki Chida, and Hirofumi Kadono "Stress behavior of ball grid array (BGA) studied by dynamic electronic speckle pattern interferometry (DESPI)", Proc. SPIE 6616, Optical Measurement Systems for Industrial Inspection V, 66162R (18 June 2007); https://doi.org/10.1117/12.726094
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KEYWORDS
Speckle pattern

Interferometry

Ferroelectric materials

Speckle

Data processing

Fringe analysis

Image filtering

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