Paper
27 November 2007 Method of nonlinear correction of two-dimensional position sensitive detector
Changtao Mo, Ming Wang, Guoyu Zhang
Author Affiliations +
Proceedings Volume 6723, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; 67232I (2007) https://doi.org/10.1117/12.783314
Event: 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Large Mirrors and Telescopes, 2007, Chengdu, China
Abstract
The position sensitive detector (PSD) is photo-electronic sensor which can detect the position of a light spot incident on its surface. Many types of non-contact dynamic displacement monitoring instruments could be constructed using PSD. How to overcome the influence of non-linearity action is the most important problem to improve measuring precision and reliability of the instrument. The output characteristic of PSD is analyzed. It is found that the output response of sensor is non-linear when the measuring range is large. In this paper we propose a method for correcting non-linearity of PSD sensor based on high precision linearization sub-block integration neural network interpolation. By using conjugate gradient algorithm of neural network which have characteristic to approach arbitrary nonlinear function, the nonlinear mapping between detecting the voltage of sensor and the outputting results are obtained by training neural network under different nonlinear condition. Experiment results indicate that not only the influence of non-linearity is eliminated effectively, but also the output of nerve network is linear.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Changtao Mo, Ming Wang, and Guoyu Zhang "Method of nonlinear correction of two-dimensional position sensitive detector", Proc. SPIE 6723, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 67232I (27 November 2007); https://doi.org/10.1117/12.783314
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KEYWORDS
Sensors

Neural networks

Evolutionary algorithms

Reliability

Nerve

Error analysis

Optical testing

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