Paper
17 January 2008 Analysis of array illumination generalized by the combination of a binary phase grating and a lens
Huai-sheng Wang
Author Affiliations +
Proceedings Volume 6723, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; 67235X (2008) https://doi.org/10.1117/12.783834
Event: 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Large Mirrors and Telescopes, 2007, Chengdu, China
Abstract
In this paper we propose a method to use a binary phase and a lens to fulfil array illumination. An equation is given to research the array illumination by a given binary phase grating and a lens. We use a lens with the two main excellences. One is that, the lens can raise the intensity of reflected light from a reflective object. Sometime the reflected light is too weak to be recorded. The other is the spatial structure to be conveniently adjusted by the binary phase grating and the lens. Thus industry measurement relevant to array illumination is more easily carried out.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Huai-sheng Wang "Analysis of array illumination generalized by the combination of a binary phase grating and a lens", Proc. SPIE 6723, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 67235X (17 January 2008); https://doi.org/10.1117/12.783834
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KEYWORDS
Binary data

Diffraction gratings

Diffraction

Near field diffraction

Fiber optic illuminators

Image processing

Optical testing

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