Paper
1 September 1987 New Approach To Reduce Exposure Times Of Mcp Tubes Below One Nanosecond
B. Lieberoth-Leden, W. Pfeiffer, P. Zipfl
Author Affiliations +
Proceedings Volume 0674, 17th Intl Congress on High Speed Photography and Photonics; (1987) https://doi.org/10.1117/12.975549
Event: 17th International Conference on High Speed Photography and Photonics, 1986, Pretoria, South Africa
Abstract
High speed gating with exposure times below 1 ns requires specially modified image intensifier tubes. This contribution deals with such a tube incorporating a dual microchannel plate (ITT F4144 mod.). In connection with a SIT-camera, single photoelectrons can be detected. For gating the tube, special avalanche circuits were developed with pulse width as small as 200 ps (FWHM). The deterioration of the gating pulse by lead inductance and tube capacitance and the attenuation caused by the surface resistance have to be regarded to evaluate the exposure time. As at least the surface resistance of the gating electrodes is unknown, direct measurements are inevitable.
© (1987) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
B. Lieberoth-Leden, W. Pfeiffer, and P. Zipfl "New Approach To Reduce Exposure Times Of Mcp Tubes Below One Nanosecond", Proc. SPIE 0674, 17th Intl Congress on High Speed Photography and Photonics, (1 September 1987); https://doi.org/10.1117/12.975549
Lens.org Logo
CITATIONS
Cited by 2 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Microchannel plates

Electrodes

Capacitance

High speed photography

Lead

Inductance

Picosecond phenomena

Back to Top