Paper
11 October 2007 Dual contribution of FTIR spectroscopy to nanoparticles characterization: surface chemistry and electrical properties
Marie-Isabelle Baraton, Lhadi Merhari
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Abstract
In a combined approach toward the optimization of chemical gas sensors, Fourier transform infrared spectroscopy is used to investigate in situ the surface reactions taking place at the surface of semiconductor nanoparticles and to simultaneously monitor the variations of the free-carrier density. The correlation between the surface reactions and the changes in the infrared absorbance under gas adsorption/desorption cycles gives information on the chemical phenomena responsible for electrical conductivity variations and therefore for the gas detection. Interaction of CO and NOX with tin oxide nanoparticles is presented and discussed. While the chemical reactions leading to the increase of the electrical conductivity under CO adsorption are relatively straightforward, the adsorption of NOX is much more complex. It is demonstrated that, although generating a strong increase of the electrical conductivity, the NOX adsorption on a fresh tin oxide surface is not fully reversible and actually poisons the surface. Subsequent NOX adsorptions lead to reversible chemical reactions even though the electrical response of the sensor is weaker.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Marie-Isabelle Baraton and Lhadi Merhari "Dual contribution of FTIR spectroscopy to nanoparticles characterization: surface chemistry and electrical properties", Proc. SPIE 6768, Nanomaterials Synthesis, Interfacing, and Integrating in Devices, Circuits, and Systems II, 676806 (11 October 2007); https://doi.org/10.1117/12.736988
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Cited by 1 scholarly publication.
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KEYWORDS
Nanoparticles

Adsorption

Tin

Absorption

Oxides

Carbon monoxide

Infrared radiation

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