Paper
8 January 2008 Transmission characteristics of T-ray multilayer interference filters
W. Withayachumnankul, B. M. Fischer, S. P. Mickan, D. Abbott
Author Affiliations +
Proceedings Volume 6801, Photonics: Design, Technology, and Packaging III; 68011G (2008) https://doi.org/10.1117/12.758811
Event: SPIE Microelectronics, MEMS, and Nanotechnology, 2007, Canberra, ACT, Australia
Abstract
An optical multilayer interference filter is made from two or more different dielectric materials layered in such a way that it promotes constructive or destructive wave interference for a selected frequency in the direction normal to the layers. Usually, each layer has the thickness of a quarter of wavelength at which the stop-band is required. In this paper, a quarter-wavelength multilayer interference filter is realised for T-ray applications. The dielectric materials used are high-resistivity silicon and free space, both of which have high transparency to T-rays and flat all-pass responses over the frequencies of interest. The designed thickness of both materials is in the order of a hundred microns, and thus allows the novelty of a retrofittable assembled structure. An analysis of the affect of the number of layers on the spectral response is given for the first time. The THz-TDS measurement of the fabricated structure is demonstrated to be in agreement with theory.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
W. Withayachumnankul, B. M. Fischer, S. P. Mickan, and D. Abbott "Transmission characteristics of T-ray multilayer interference filters", Proc. SPIE 6801, Photonics: Design, Technology, and Packaging III, 68011G (8 January 2008); https://doi.org/10.1117/12.758811
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KEYWORDS
Terahertz radiation

Transmittance

Optical filters

Silicon

Multilayer interference

Mirrors

Dielectrics

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