Depth scanning with wavelength-stepped laser-diode interferometer

Ribun Onodera; Yukihiro Ishii

doi:10.1117/12.760940

26 November 2007 Depth scanning with wavelength-stepped laser-diode interferometer

Ribun Onodera, Yukihiro Ishii

Proceedings Volume 6829, Advanced Materials and Devices for Sensing and Imaging III; 682909 (2007) https://doi.org/10.1117/12.760940
Event: Photonics Asia 2007, 2007, Beijing, China

Abstract

We develop a laser-diode (LD) interferometer for depth profiling. Interference signals are produced by the reflections from the reference mirror and the distributed objects. Four-step current modulation into the LD produces phase shifts with four steps that have a value proportional to the distance from the reference mirror image to the reflection cite and the modulation amplitude. The value of phase shift is gradually increased by changing the amplitude of current modulation. The locations of the reflection cite are measured from the modulation amplitude when the value of phase shifts is suited to π/2.

Citation Download Citation

Ribun Onodera and Yukihiro Ishii "Depth scanning with wavelength-stepped laser-diode interferometer", Proc. SPIE 6829, Advanced Materials and Devices for Sensing and Imaging III, 682909 (26 November 2007); https://doi.org/10.1117/12.760940

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