A new camera calibration method for phase measuring profilometry

Di Wu; Naiguang Lu

doi:10.1117/12.755536

24 January 2008 A new camera calibration method for phase measuring profilometry

Di Wu, Naiguang Lu

Proceedings Volume 6829, Advanced Materials and Devices for Sensing and Imaging III; 68291E (2008) https://doi.org/10.1117/12.755536
Event: Photonics Asia 2007, 2007, Beijing, China

Abstract

In structured light vision measurement, it is vital to keep the measurement system stable because the system organization determines some important parameters used in 3D reconstruction. Aimed at this feature, a new camera calibration method is presented in the paper. This method utilizes a digital guide and a planar pattern to construct a visual 3D target. Through linear transformation and nonlinear optimization, the extrinsic and intrinsic camera parameters can be obtained iteratively. This method combines the merits of 3D pattern with planar pattern. The procedure of calibration is simple and convenient. The result is accurate by this method and meets the need of structured light vision measurement.

Citation Download Citation

Di Wu and Naiguang Lu "A new camera calibration method for phase measuring profilometry", Proc. SPIE 6829, Advanced Materials and Devices for Sensing and Imaging III, 68291E (24 January 2008); https://doi.org/10.1117/12.755536

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