Paper
12 August 1986 Synchrotron Radiation Beam Lines As X-Ray Calibration Sources
J. P. Kirkland, R. A. Neiser, W. T. Elam, J. C. Rife, W. R. Hunter
Author Affiliations +
Abstract
Many beam lines have become available at storage rings and synchrotrons around the world, presenting the opportunity to use them as calibration sources in the VUV, soft and hard X-ray regions. Synchrotron radiation is unique in offering a high intensity, highly polarized, continuous spectrum in a single source. Other important characteristics such as high brightness, narrow or broad spectral width, degree of polarization, and spectral purity depend on a beam line's optics. A typical beam line at the National Synchrotron Light Source (NSLS) at Brookhaven National Laboratory will have photon fluxes of approximately 1011 photons/sec with resolution (Δe/e) of greater than 7x10-4 into areas of 1 to 30 mm2. The characterization of these sources and their use for calibration of diverse x-ray instrumentation are discussed. Illustrative data for PIN and photoelectron x-ray detectors is given.
© (1986) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
J. P. Kirkland, R. A. Neiser, W. T. Elam, J. C. Rife, and W. R. Hunter "Synchrotron Radiation Beam Lines As X-Ray Calibration Sources", Proc. SPIE 0689, X-Ray Calibration: Techniques, Sources, and Detectors, (12 August 1986); https://doi.org/10.1117/12.936581
Lens.org Logo
CITATIONS
Cited by 3 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Synchrotrons

Sensors

Calibration

X-rays

Mirrors

Synchrotron radiation

Crystals

RELATED CONTENT


Back to Top