Electron microscopy and spectroscopy of thinfilms for spectral storage

F. Bezares; Zameer Hasan

doi:10.1117/12.771741

19 February 2008 Electron microscopy and spectroscopy of thinfilms for spectral storage

F. Bezares, Zameer Hasan

Proceedings Volume 6903, Advanced Optical Concepts in Quantum Computing, Memory, and Communication; 690307 (2008) https://doi.org/10.1117/12.771741
Event: Integrated Optoelectronic Devices 2008, 2008, San Jose, California, United States

Abstract

Rare earth doped thin-films have been produced using laser pulse vapor deposition technique. By changing the thin film growth environment inside the chamber, we were able to create several optical centers. Emission and absorption spectroscopy measurements performed on these structures confirm that that these thinfilms are suitable candidates to be used for ultra-high density spectral storage applications. Scanning electron microscopy studies of these thinfilms were conducted to study degradation in their optical quality upon long-term storage. Results on microscopy show that the deterioration is initiated by nano-gaps and cracks in the capping layer of zinc sulfide.

Citation Download Citation

F. Bezares and Zameer Hasan "Electron microscopy and spectroscopy of thinfilms for spectral storage", Proc. SPIE 6903, Advanced Optical Concepts in Quantum Computing, Memory, and Communication, 690307 (19 February 2008); https://doi.org/10.1117/12.771741

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