X-ray Microtomography with Synchrotron Radiation

D. K. Bowen; J. S. Elliott; S. R. Stock; S. D. Dover

doi:10.1117/12.936625

12 August 1986 X-ray Microtomography with Synchrotron Radiation

D. K. Bowen, J. S. Elliott, S. R. Stock, S. D. Dover

Proceedings Volume 0691, X-Ray Imaging II; (1986) https://doi.org/10.1117/12.936625
Event: 30th Annual Technical Symposium, 1986, San Diego, United States

Abstract

High resolution x-ray microtomography has been established at the synchrotron radiation source at Daresbury Laboratory, U.K. A high precision mechanical stage with two translational and one rotational degree of freedom has been constructed, and fully characterised by mechanical metrology; overall precision is better than 0.5 μm. Collimation of the incident synchrotron radiation beam through a 4 pm aperture has been obtained, giving 2 μm overall spatial resolution. Results have been obtained using monochromatic radiation at both 1 angstrom and 0.37 angstrom wavelengths, on human bone fragments and on sintered alumina ceramics.

Citation Download Citation

D. K. Bowen, J. S. Elliott, S. R. Stock, and S. D. Dover "X-ray Microtomography with Synchrotron Radiation", Proc. SPIE 0691, X-Ray Imaging II, (12 August 1986); https://doi.org/10.1117/12.936625

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