Paper
18 April 2008 A high-speed, MWIR reference source for FPA non-uniformity correction using negative luminescence
James W. Edwards, Jean Giess, Andrew Graham, Neil T. Gordon, Mary K. Haigh, Janet E. Hails, David J. Hall, Alan J. Hydes, David J. Lees, Stuart J. Smith
Author Affiliations +
Abstract
We have previously discussed the potential of using a Hg1-xCdxTe source as a reference plane for the non-uniformity correction of thermal imagers and which is being developed as an option for the UK 3rd generation, high performance thermal imaging program (Albion). In this paper we will present our first results on a large area (1.5 cm x 1.5 cm) source which was grown on a silicon substrate and can simulate a range of temperatures from -10 °C to +30 °C. Due to the fast switching speed, the apparent temperature can be changed on a frame by frame basis. Also, the operation of the device can be synchronized to the integration time of the camera to reduce the mean power requirements by a factor of 10 and reduce thermal heating effects. The main applications for Hg1-xCdxTe devices as high-performance, cryogenically-cooled detectors typically require very low drive currents. The use of this material for large-area LEDs has generated new challenges to deal with the high peak currents. These are typically in the range 1-2 A/cm2 for a MWIR waveband source and have led to a need to reduce the common impedance, reduce the contact resistances and consider the effects of current crowding.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
James W. Edwards, Jean Giess, Andrew Graham, Neil T. Gordon, Mary K. Haigh, Janet E. Hails, David J. Hall, Alan J. Hydes, David J. Lees, and Stuart J. Smith "A high-speed, MWIR reference source for FPA non-uniformity correction using negative luminescence", Proc. SPIE 6940, Infrared Technology and Applications XXXIV, 69402J (18 April 2008); https://doi.org/10.1117/12.786617
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KEYWORDS
Diodes

Nonuniformity corrections

Cameras

Temperature metrology

Infrared radiation

Calibration

Luminescence

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