Ray-tracing of shape metrology data of grazing incidence x-ray astronomy mirrors

Fabio E. Zocchi; Dervis Vernani

doi:10.1117/12.790628

15 July 2008 Ray-tracing of shape metrology data of grazing incidence x-ray astronomy mirrors

Fabio E. Zocchi, Dervis Vernani

Proceedings Volume 7011, Space Telescopes and Instrumentation 2008: Ultraviolet to Gamma Ray; 701118 (2008) https://doi.org/10.1117/12.790628
Event: SPIE Astronomical Telescopes + Instrumentation, 2008, Marseille, France

Abstract

A number of future X-ray astronomy missions (e.g. Simbol-X, eROSITA) plan to utilize high throughput grazing incidence optics with very lightweight mirrors. The severe mass specifications require a further optimization of the existing technology with the consequent need of proper optical numerical modeling capabilities for both the masters and the mirrors. A ray tracing code has been developed for the simulation of the optical performance of type I Wolter masters and mirrors starting from 2D and 3D metrology data. In particular, in the case of 2D measurements, a 3D data set is reconstructed on the basis of dimensional references and used for the optical analysis by ray tracing. In this approach, the actual 3D shape is used for the optical analysis, thus avoiding the need of combining the separate contributions of different 2D measurements that require the knowledge of their interactions which is not normally available. The paper describes the proposed approach and presents examples of application on a prototype engineering master in the frame of ongoing activities carried out for present and future X-ray missions.

Citation Download Citation

Fabio E. Zocchi and Dervis Vernani "Ray-tracing of shape metrology data of grazing incidence x-ray astronomy mirrors", Proc. SPIE 7011, Space Telescopes and Instrumentation 2008: Ultraviolet to Gamma Ray, 701118 (15 July 2008); https://doi.org/10.1117/12.790628

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