Angle-dependent infrared reflectance measurements in support of VIIRS

Simon G. Kaplan; Enrique J. Iglesias; Leonard M. Hanssen

doi:10.1117/12.798263

3 September 2008 Angle-dependent infrared reflectance measurements in support of VIIRS

Simon G. Kaplan, Enrique J. Iglesias, Leonard M. Hanssen

Proceedings Volume 7082, Infrared Spaceborne Remote Sensing and Instrumentation XVI; 70820X (2008) https://doi.org/10.1117/12.798263
Event: Optical Engineering + Applications, 2008, San Diego, California, United States

Abstract

We have developed a goniometric reflectometer using a Fourier-transform infrared (FTIR) spectrometer source for polarized reflectance measurements from 1 μm to 20 μm wavelength at angles of incidence from 10° to 80°, with an incident beam geometry of approximately f/25. Measurements are performed in either absolute mode, or relative to a reference mirror that has been calibrated at near-normal incidence using an integrating sphere-based reflectometer. Uncertainties in the 0.2 % to 0.5 % range are achieved using a photoconductive 77 K InSb detector from 1 μm to 5 μm and a 12 K Si:As BIB detector from 2 μm to 20 μm. The performance of the system has been tested using dielectric materials such as Si as well as high-quality Au mirrors. We describe measurements of SiO_x-coated Ag mirrors to assess their performance for such applications as the half-angle mirror (HAM) in the VIIRS optical scanning system. Various coatings are analyzed to help assess the effect of p-polarized absorption bands at angles of incidence from 10° to 65° and wavelengths between 3 μm and 13 μm.

Citation Download Citation

Simon G. Kaplan, Enrique J. Iglesias, and Leonard M. Hanssen "Angle-dependent infrared reflectance measurements in support of VIIRS", Proc. SPIE 7082, Infrared Spaceborne Remote Sensing and Instrumentation XVI, 70820X (3 September 2008); https://doi.org/10.1117/12.798263

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