Robustness of photonic MEMS adaptive coded aperture imagers to technology defects and yields

Oren Sternberg; Esko Jaska

doi:10.1117/12.794029

19 August 2008 Robustness of photonic MEMS adaptive coded aperture imagers to technology defects and yields

Oren Sternberg, Esko Jaska

Proceedings Volume 7096, Adaptive Coded Aperture Imaging and Non-Imaging Sensors II; 70960H (2008) https://doi.org/10.1117/12.794029
Event: Optical Engineering + Applications, 2008, San Diego, California, United States

Abstract

Photonic MEMS technology as it pertains to adaptive coded aperture sensing is an emerging technology offering an increase to imaging performance compared to a fixed system in the EO/IR wavelength region. In this paper we address the effects of potential manufacturing yield and defects. A 1-d first order optical model is developed in an attempt to correlate the optical/system performance to the manufacturing defects and yield output. The imager is found to be extremely robust to both random and correlated failures in the coded aperture, so long as the aperture code is adapted to the aperture failures.

Citation Download Citation

Oren Sternberg and Esko Jaska "Robustness of photonic MEMS adaptive coded aperture imagers to technology defects and yields", Proc. SPIE 7096, Adaptive Coded Aperture Imaging and Non-Imaging Sensors II, 70960H (19 August 2008); https://doi.org/10.1117/12.794029

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available