Paper
25 September 2008 Development of a goniometric light scatter instrument with sample imaging ability
Author Affiliations +
Abstract
The principle of a new scattering measurement system including a mobile lighting and a fixed CCD array is described. This new system allows a spatially resolved light scattering characterization. Moreover it is possible to separate localized defects contribution from the local roughness measurement. The comprehensive characterization of optical coatings can be performed with this set-up, and some examples will be given.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Myriam Zerrad, Michel Lequime, Carole Deumié, and Claude Amra "Development of a goniometric light scatter instrument with sample imaging ability", Proc. SPIE 7102, Optical Fabrication, Testing, and Metrology III, 710207 (25 September 2008); https://doi.org/10.1117/12.797621
Lens.org Logo
CITATIONS
Cited by 3 scholarly publications and 1 patent.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Bidirectional reflectance transmission function

Light sources and illumination

Light scattering

Charge-coupled devices

CCD cameras

Objectives

Scattering

Back to Top