Microfabricated scanning near-field probe for sub-terahertz spectroscopy

Kentaro Iwami; Takahito Ono; Masayoshi Esashi

doi:10.1117/12.807261

12 January 2009 Microfabricated scanning near-field probe for sub-terahertz spectroscopy

Kentaro Iwami, Takahito Ono, Masayoshi Esashi

Proceedings Volume 7133, Fifth International Symposium on Instrumentation Science and Technology; 713313 (2009) https://doi.org/10.1117/12.807261
Event: International Symposium on Instrumentation Science and Technology, 2008, Shenyang, China

Abstract

This paper reports design, fabrication and evaluation of a novel scanning near-field probe for terahertz (THz) local time domain spectroscopy (THz-TDS). A microfabricated scanning near-field optical microscopy (SNOM) probe was assembled with a low-temperature-grown gallium arsenide (LT-GaAs) photoconductive antenna. The probe structure was evaluated and determined by a finite-difference time-domain (FDTD) numerical simulation. The assembly was used as the THz emitter and local THz source. Another LT-GaAs antenna situated at the opposite side was used as the detector. A THz-TDS measurement using the microfabricated SNOM probe and photoconductive antenna was performed.

Citation Download Citation

Kentaro Iwami, Takahito Ono, and Masayoshi Esashi "Microfabricated scanning near-field probe for sub-terahertz spectroscopy", Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 713313 (12 January 2009); https://doi.org/10.1117/12.807261

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