Paper
12 January 2009 Measurement of nano-particles size by evanescent interference field with conventional optical microscope
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Proceedings Volume 7133, Fifth International Symposium on Instrumentation Science and Technology; 71333C (2009) https://doi.org/10.1117/12.807618
Event: International Symposium on Instrumentation Science and Technology, 2008, Shenyang, China
Abstract
The size of a particle smaller than the diffraction limit is measured using a conventional optical microscope by adopting a standing wave evanescent field illumination. The scattering intensity from a nanoparticle is periodically modulated by shifting the intensity fringes of standing evanescent field. By measuring the intensity variation of scattered light during one cycle of modulation, particle sizes can be easily estimated. Furthermore, this technique has weak dependence on the material of particles. From the experimental result, the particle size ranging from 20 to 250 nm is successfully determined. This technique offers a low-cost size measurement for nanoparticles.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Xiang Yu, Yukihiro Araki, Kentaro Iwami, and Norihiro Umeda "Measurement of nano-particles size by evanescent interference field with conventional optical microscope", Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71333C (12 January 2009); https://doi.org/10.1117/12.807618
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