Topological quantum image analysis

George Chapline; Jonathan L. DuBois

doi:10.1117/12.817053

27 April 2009 Topological quantum image analysis

George Chapline, Jonathan L. DuBois

Proceedings Volume 7342, Quantum Information and Computation VII; 73420C (2009) https://doi.org/10.1117/12.817053
Event: SPIE Defense, Security, and Sensing, 2009, Orlando, Florida, United States

Abstract

A new approach to analyzing visual images is proposed, based on the idea of converting an optical image into a spatially varying pattern of polarized squeezed light, which is then used to produce a pattern of chiral edge currents in a thin film topological insulator. Thin films of Bi or Bi doped with Sb which are punctured with an array of sub-micron holes may be a way of realizing this kind of optical quantum information processing.

Citation Download Citation

George Chapline and Jonathan L. DuBois "Topological quantum image analysis", Proc. SPIE 7342, Quantum Information and Computation VII, 73420C (27 April 2009); https://doi.org/10.1117/12.817053

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