Paper
28 August 2009 The study of absolute distance measurement based on the self-mixing interference in laser diode
Ting-ting Wang, Chuang Zhang
Author Affiliations +
Proceedings Volume 7382, International Symposium on Photoelectronic Detection and Imaging 2009: Laser Sensing and Imaging; 73821E (2009) https://doi.org/10.1117/12.835003
Event: International Symposium on Photoelectronic Detection and Imaging 2009, 2009, Beijing, China
Abstract
In this work, an absolute distance measurement method based on the self-mixing interference is presented. The principles of the method used three-mirror cavity equivalent model are studied in this paper, and the mathematical model is given. Wavelength modulation of the laser beam is obtained by saw-tooth modulating the infection current of the laser diode. Absolute distance of the external target is determined by Fourier analysis method. The frequency of signal from PD is linearly dependent on absolute distance, but also affected by temperature and fluctuation of current source. A dual-path method which uses the reference technique for absolute distance measurement has been proposed. The theoretical analysis shows that the method can eliminate errors resulting from distance-independent variations in the setup. Accuracy and stability can be improved. Simulated results show that a resolution of ±0.2mm can be achieved for absolute distance ranging from 250mm to 500mm. In the same measurement range, the resolution we obtained is better than other absolute distance measurement system proposed base on self-mixing interference.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ting-ting Wang and Chuang Zhang "The study of absolute distance measurement based on the self-mixing interference in laser diode", Proc. SPIE 7382, International Symposium on Photoelectronic Detection and Imaging 2009: Laser Sensing and Imaging, 73821E (28 August 2009); https://doi.org/10.1117/12.835003
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KEYWORDS
Distance measurement

Modulation

Semiconductor lasers

Error analysis

Technetium

Laser resonators

Mathematical modeling

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