Developing an accelerated life test method for LED drivers

Lei Han; Nadarajah Narendran

doi:10.1117/12.829901

18 August 2009 Developing an accelerated life test method for LED drivers

Lei Han, Nadarajah Narendran

Proceedings Volume 7422, Ninth International Conference on Solid State Lighting; 742209 (2009) https://doi.org/10.1117/12.829901
Event: SPIE Optical Engineering + Applications, 2009, San Diego, California, United States

Abstract

Although light-emitting diodes (LEDs) have the potential for long life, LED luminaires may experience a much shorter life for the system as a whole because of the driver. Past studies show that the electrolytic capacitor used in switch-mode power supplies often has the shortest lifetime, and thus determines the electronic driver lifetime. This study demonstrated an accelerated life test method for LED drivers that use electrolytic capacitors at the output stage by monitoring the output current ripple trends at different elevated operating temperatures.

Citation Download Citation

Lei Han and Nadarajah Narendran "Developing an accelerated life test method for LED drivers", Proc. SPIE 7422, Ninth International Conference on Solid State Lighting, 742209 (18 August 2009); https://doi.org/10.1117/12.829901

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