Nonlinear spectroscopy: absorption and refraction

Eric Van Stryland; David Hagan; Scott Webster; Lazaro Padilha

doi:10.1117/12.834788

31 December 2009 Nonlinear spectroscopy: absorption and refraction

Eric Van Stryland, David Hagan, Scott Webster, Lazaro Padilha

Proceedings Volume 7504, Laser-Induced Damage in Optical Materials: 2009; 750415 (2009) https://doi.org/10.1117/12.834788
Event: Laser Damage Symposium XLI: Annual Symposium on Optical Materials for High Power Lasers, 2009, Boulder, Colorado, United States

Abstract

We have been developing tools for nonlinear spectroscopy aimed toward the ultimate goal of building a nonlinear spectrophotometer analogous to the ubiquitous linear spectrophotometer where a sample is placed in the instrument, a button is pushed, and the absorption spectrum is obtained sometime later. This paper describes our progress toward this goal, describing many difficulties and complications as well as opportunities. We also show spectroscopic data and analysis of a variety of materials that we have taken with preliminary nonlinear spectroscopic instrumentation we have already developed. One of the more interesting observations obtained along this research path is the realization that linear dispersion theory can also be applied to nonlinear systems when formulated properly such that Kramers-Kronig relations can be used to connect the dispersion of nonlinear refraction to the spectrum of nonlinear absorption. In some circumstances this can be more easily applied to nonlinear systems than to linear systems since the nonlinear absorption spectrum can be limited in wavelength. In addition, we have developed tools that can simultaneously give the spectrum of nonlinear absorption as well as the dispersion of the nonlinear refraction over an octave spectral range from 400nnm to 800 nm, the so called White-Light-Continuum Z-scan. Much of the research on nonlinear optical materials has been a collaborative effort requiring the skills and expertise of organic chemists and materials manufacturers. The goals of this part of the research are to determine predictive structure-property relation capabilities. The database needed for this research makes the nonlinear spectrophotometer a necessity.

Citation Download Citation

Eric Van Stryland, David Hagan, Scott Webster, and Lazaro Padilha "Nonlinear spectroscopy: absorption and refraction", Proc. SPIE 7504, Laser-Induced Damage in Optical Materials: 2009, 750415 (31 December 2009); https://doi.org/10.1117/12.834788

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KEYWORDS

Absorption

Refraction

Nonlinear optics

Transmittance

Semiconductors

Spectroscopy

Dispersion

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