Paper
23 October 2009 Highly reliable data layout schemes for very large scale storage systems
Dongjian Luo, Haifeng Zhong, Wei Wu
Author Affiliations +
Abstract
In this paper, we investigate data layout schemes and their impact on system reliability in a petabyte scale storage system built from thousands of Object-Based Storage Devices. We delve in two underlying data layout schemes: RAID 5 and RAID 5 mirroring. To accelerate data reconstruction, Fast Mirroring Copy is employed where the reconstructed objects are stored on different OBSDs throughout the system. In order to improve the system reliability, SMART Reliability Mechanism (SRM) is introduced for enhancing the reliability in very large-scale storage system. Analysis results show that they can be used to assure the reliability of data storage and efficiently utilize the disk resource while exert minimum impact on the whole systems performance.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Dongjian Luo, Haifeng Zhong, and Wei Wu "Highly reliable data layout schemes for very large scale storage systems", Proc. SPIE 7517, Photonics and Optoelectronics Meetings (POEM) 2009: Optical Storage and New Storage Technologies, 75170T (23 October 2009); https://doi.org/10.1117/12.845964
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KEYWORDS
Reliability

Data storage

Computing systems

Data processing

Data backup

Mirrors

Optoelectronics

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