Principal problems of quality improvement for high-speed planar transmission lines issued from studies of high-Q microstrip resonators

A. P. Chernyaev; V. A. Dravin; A. Yu. Golovanov; A. L. Karuzskii; A. E. Krapivka; A. N. Lykov; V. N. Murzin; A. V. Perestoronin; A. M. Tskhovrebov; N. A. Volchkov

doi:10.1117/12.854461

26 February 2010 Principal problems of quality improvement for high-speed planar transmission lines issued from studies of high-Q microstrip resonators

A. P. Chernyaev, V. A. Dravin, A. Yu. Golovanov, A. L. Karuzskii, A. E. Krapivka, A. N. Lykov, V. N. Murzin, A. V. Perestoronin, A. M. Tskhovrebov, N. A. Volchkov

Author Affiliations +

Proceedings Volume 7521, International Conference on Micro- and Nano-Electronics 2009; 752119 (2010) https://doi.org/10.1117/12.854461
Event: International Conference on Micro- and Nano-Electronics 2009, 2009, Zvenigorod, Russian Federation

Abstract

Possible approaches to improvement of quality of a high-speed planar transmission line are investigated by systematic study of superconductor high-Q microstrip resonators in the frequency range of order 10 GHz. Superconductor microstrip resonators with maximal highest quality-factors Q>10⁵ were constructed. Relative contributions of spectral (geometrical and non-dissipative material properties), on one hand, and of dissipative (losses in materials) characteristics, on another hand, into the limitation of maximal achievable values of the quality of microstrip resonators are investigated. It is shown that the highest by now Q≥10⁵ are limited dominantly by the spectral properties of microstrip resonators.

Citation Download Citation

A. P. Chernyaev, V. A. Dravin, A. Yu. Golovanov, A. L. Karuzskii, A. E. Krapivka, A. N. Lykov, V. N. Murzin, A. V. Perestoronin, A. M. Tskhovrebov, and N. A. Volchkov "Principal problems of quality improvement for high-speed planar transmission lines issued from studies of high-Q microstrip resonators", Proc. SPIE 7521, International Conference on Micro- and Nano-Electronics 2009, 752119 (26 February 2010); https://doi.org/10.1117/12.854461

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available