Novel sub-pixel feature point extracting algorithm for three-dimensional measurement system with linear-structure light

Weiguang Zhang; Nan Cao; Haiyan Guo

doi:10.1117/12.864563

11 October 2010 Novel sub-pixel feature point extracting algorithm for three-dimensional measurement system with linear-structure light

Weiguang Zhang, Nan Cao, Haiyan Guo

Author Affiliations +

Proceedings Volume 7656, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; 76563V (2010) https://doi.org/10.1117/12.864563
Event: 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies, 2010, Dalian, China

Abstract

Light strip feature point extracting is a key topic in three-dimensional measurement system with linear-structure light developing process. A novel algorithm of sub-pixel feature point extracting is proposed. The algorithm uses Gaussian low-pass filter to smooth light strip image, adopts edge detection and morphological algorithm to obtain segmentation regions of light strip image. According to it's curvature properties, edge curve of a segmented region are divided into two data sets. K-d tree algorithm is used to search for the closest point from one data set to another and build up two points group. Based on each points group, image gray distribution of a light strip section can be obtained, and then the feature point of one light strip section is calculated with spline interpolation algorithm. The position of extracting feature point in light strip image is selected flexibly on the basis of measurement system parameters. Therefore, the algorithm can effectively correct feature point extracting error for light strip image with asymmetric and incomplete property. The results show the algorithm not only extracts the strip feature point accurately, and but also has good anti-noise and robust performance and more extensive applicability.

Citation Download Citation

Weiguang Zhang, Nan Cao, and Haiyan Guo "Novel sub-pixel feature point extracting algorithm for three-dimensional measurement system with linear-structure light", Proc. SPIE 7656, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 76563V (11 October 2010); https://doi.org/10.1117/12.864563

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available