Paper
20 August 2010 Research on the consistency of LVQ classifier
Qing-Wen Zhou, Kai Wang, Qing-Ren Wang
Author Affiliations +
Proceedings Volume 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering; 78202H (2010) https://doi.org/10.1117/12.866975
Event: International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 2010, Xi'an, China
Abstract
As a self-organizing artificial neural network model based on supervised learning, the LVQ classifier has been widely applied and deeply studied due to its good practical performance on the pattern recognition problems. The improved LVQ classifier have been greatly developed in previous works, and the experimental results on specific problems show that the improved LVQ classifier is indeed better than the standard learning algorithms proposed by Kohonen. Different from previous works, the consistency is studied in this paper to provide a theoretical support for the LVQ classifier. Furthermore, a simulation is included in this paper to provide an experimental support for our theoretical work.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Qing-Wen Zhou, Kai Wang, and Qing-Ren Wang "Research on the consistency of LVQ classifier", Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78202H (20 August 2010); https://doi.org/10.1117/12.866975
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KEYWORDS
Error analysis

Monte Carlo methods

Pattern recognition

Detection and tracking algorithms

Statistical analysis

Algorithm development

Artificial neural networks

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