Paper
7 February 2011 Non-parametric texture defect detection using Weibull features
Fabian Timm, Erhardt Barth
Author Affiliations +
Proceedings Volume 7877, Image Processing: Machine Vision Applications IV; 78770J (2011) https://doi.org/10.1117/12.872463
Event: IS&T/SPIE Electronic Imaging, 2011, San Francisco Airport, California, United States
Abstract
The detection of abnormalities is a very challenging problem in computer vision, especially if these abnormalities must be detected in images of textured surfaces such as textile, stone, or wood. We propose a novel, non-parametric approach for defect detection in textures that only employs two features. We compute the two parameters of a Weibull fit for the distribution of image gradients in local regions. Then, we perform a simple novelty detection algorithm in order to detect arbitrary deviations of the reference texture. Therefore, we evaluate the Euclidean distances of all local patches to a reference point in the Weibull space, where the reference point is determined for each texture image individually. Thus, our approach becomes independent of the particular texture type and also independent of a certain defect type. For performance evaluation we use the highly challenging database provided by Bosch for a contest on industrial optical inspection with different classes of textures and different defect types. By using the Weibull parameters we can detect local deviations of texture images in an unsupervised manner with high accuracy. Compared to existing approaches such as Gabor filters or grey level statistics, our approach is not only powerful, but also very efficient such that it can also be applied for real-time applications.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Fabian Timm and Erhardt Barth "Non-parametric texture defect detection using Weibull features", Proc. SPIE 7877, Image Processing: Machine Vision Applications IV, 78770J (7 February 2011); https://doi.org/10.1117/12.872463
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Cited by 35 scholarly publications.
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KEYWORDS
Defect detection

Statistical analysis

Image filtering

Error analysis

Gaussian filters

Machine vision

Optical filters

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