Cathodoluminescence spectroscopy on selectively grown GaN nanowires

T. Schumann; T. Gotschke; F. Limbach; T. Stoica; R. Calarco

doi:10.1117/12.878836

2 March 2011 Cathodoluminescence spectroscopy on selectively grown GaN nanowires

T. Schumann, T. Gotschke, F. Limbach, T. Stoica, R. Calarco

Proceedings Volume 7939, Gallium Nitride Materials and Devices VI; 793903 (2011) https://doi.org/10.1117/12.878836
Event: SPIE OPTO, 2011, San Francisco, California, United States

Abstract

GaN nanowires (NWs) were grown selectively on Si(111) substrate without catalyst by plasma-assisted molecular-beam epitaxy under N-rich conditions. The selective growth was obtained using regular arrays of holes patterned in a silicon oxide layer on top of a thin AlN buffer. The optical properties of the selectively grown GaN NWs have been studied using cathodoluminescence (CL) spectroscopy. Both, CL spectra measured on NW ensembles and spatially resolved monochromatic images were investigated. From a comparison of morphology and CL studies it emerges that NW coalescence is responsible for the appearance of the defect related emission.

Citation Download Citation

T. Schumann, T. Gotschke, F. Limbach, T. Stoica, and R. Calarco "Cathodoluminescence spectroscopy on selectively grown GaN nanowires", Proc. SPIE 7939, Gallium Nitride Materials and Devices VI, 793903 (2 March 2011); https://doi.org/10.1117/12.878836

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