Electro-Optic Sampling: Device Embodiments And Possibilities

Gerard A. Mourou

doi:10.1117/12.940982

2 February 1988 Electro-Optic Sampling: Device Embodiments And Possibilities

Gerard A. Mourou

Proceedings Volume 0795, Characterization of Very High Speed Semiconductor Devices and Integrated Circuits; (1988) https://doi.org/10.1117/12.940982
Event: Advances in Semiconductors and Semiconductor Structures, 1987, Bay Point, FL, United States

Abstract

Short optical pulses have been involved in a number of areas of science and technology. It is now possible to generate optical pulses of less than 10 fs duration corresponding to only a few optical cycles. One of the most important applications of these short optical pulses is in electronics, where, in conjunction with the electro-optic effect, electrical waveforms now can be characterized with a few hundred femtosecond resolution - corresponding to 1 THz in bandwidth. This technique makes possible the characterization in situ of high-speed optoelectronic and electronic devices as well as circuits operating in the picosecond time scale or 100 GHz frequency domain.

Citation Download Citation

Gerard A. Mourou "Electro-Optic Sampling: Device Embodiments And Possibilities", Proc. SPIE 0795, Characterization of Very High Speed Semiconductor Devices and Integrated Circuits, (2 February 1988); https://doi.org/10.1117/12.940982

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