Micro- and nano-electronic technologies and their qualification methodology for space applications under harsh environments

Yuan Chen; Carissa Tudryn Weber; Mohammad Mojarradi; Elizabeth Kolawa

doi:10.1117/12.884680

13 May 2011 Micro- and nano-electronic technologies and their qualification methodology for space applications under harsh environments

Yuan Chen, Carissa Tudryn Weber, Mohammad Mojarradi, Elizabeth Kolawa

Author Affiliations +

Proceedings Volume 8031, Micro- and Nanotechnology Sensors, Systems, and Applications III; 80311Y (2011) https://doi.org/10.1117/12.884680
Event: SPIE Defense, Security, and Sensing, 2011, Orlando, Florida, United States

Abstract

This paper gives a brief overview of the micro- and nano-electronic technologies for space applications under harsh environments, i.e. for operating temperatures beyond the range of -55°C to 125°C, and with exposure to radiation, pressure, shock, etc. The paper also addresses the technology reliability, the challenges and the qualification approaches for the harsh environment applications with a case study. The case study highlights the design-for-reliability approach and space qualification methodology developed to successfully design, fabricate, qualify, and infuse a motor drive electronics assembly with micro- and nano-electronics and packaging technology into a flight mission, which requires an operational temperature range over -128°C to +85°C.

Citation Download Citation

Yuan Chen, Carissa Tudryn Weber, Mohammad Mojarradi, and Elizabeth Kolawa "Micro- and nano-electronic technologies and their qualification methodology for space applications under harsh environments", Proc. SPIE 8031, Micro- and Nanotechnology Sensors, Systems, and Applications III, 80311Y (13 May 2011); https://doi.org/10.1117/12.884680

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