Paper
6 May 2011 Silicon SPAD with near-infrared enhanced spectral response
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Abstract
We introduce a novel SPAD device with high photon detection efficiency and good performances in terms of temporal resolution and dark count rate. The designed detectors are able to attain a PDE as high as 40% at a wavelength of 800 nm while keeping photon detection jitter below 100 ps. The device was fabricated with a suitable planar silicon technology process that allows the development of detector arrays.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Francesco Panzeri, Angelo Gulinatti, Ivan Rech, Massimo Ghioni, and Sergio Cova "Silicon SPAD with near-infrared enhanced spectral response", Proc. SPIE 8072, Photon Counting Applications, Quantum Optics, and Quantum Information Transfer and Processing III, 807206 (6 May 2011); https://doi.org/10.1117/12.887021
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Cited by 1 scholarly publication and 1 patent.
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KEYWORDS
Photodetectors

Doping

Silicon

Picosecond phenomena

Absorption

Sensors

Time correlated photon counting

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