Luminescence decay times of PdOEP:PVK OLEDs fabricated in controlled O2 and H2O environments

Weipan Cui; Rui Liu; Alex Smith; Joseph Shinar; Ruth Shinar

doi:10.1117/12.894709

16 September 2011 Luminescence decay times of PdOEP:PVK OLEDs fabricated in controlled O₂ and H₂O environments

Weipan Cui, Rui Liu, Alex Smith, Joseph Shinar, Ruth Shinar

Proceedings Volume 8118, Organic Semiconductors in Sensors and Bioelectronics IV; 81180V (2011) https://doi.org/10.1117/12.894709
Event: SPIE Photonic Devices + Applications, 2011, San Diego, California, United States

Abstract

Residual levels of O₂ in OLEDs and their relation to device performance were evaluated by measuring (i) the photoluminescence (PL) decay time (following pulsed UV LED excitation) of the O₂ sensing dye Pd octaethylporphyrin (PdOEP) doped in the active OLED layer poly(N-vinyl carbazole) (PVK) and (ii) the electroluminescence (EL) decay time (following a bias pulse) of glass/ITO/PEDOT:PSS/6 wt.% PdOEP:PVK/CsF/Al OLEDs. The active layer was prepared under various conditions of exposure to controlled O2 levels and relative humidity. PdOEP was used successfully for monitoring exposure of PdOEP:PVK to low levels of oxygen and shortened device PL decay times often indicated device deterioration. The PL decay time at various applied voltages and the EL decay time at various current densities were monitored to evaluate degradation processes related to oxygen and other bimolecular quenching phenomena.

Citation Download Citation

Weipan Cui, Rui Liu, Alex Smith, Joseph Shinar, and Ruth Shinar "Luminescence decay times of PdOEP:PVK OLEDs fabricated in controlled O₂ and H₂O environments", Proc. SPIE 8118, Organic Semiconductors in Sensors and Bioelectronics IV, 81180V (16 September 2011); https://doi.org/10.1117/12.894709

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