An experimental apparatus for normal spectral emissivity measurement

Kun Yu; Yufang Liu; Guangrui Jia; Deheng Shi

doi:10.1117/12.907003

5 December 2011 An experimental apparatus for normal spectral emissivity measurement

Kun Yu, Yufang Liu, Guangrui Jia, Deheng Shi

Proceedings Volume 8197, 2011 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments; 81971C (2011) https://doi.org/10.1117/12.907003
Event: International Conference on Optical Instruments and Technology (OIT2011), 2011, Beijing, Beijing, China

Abstract

Based on the definition of spectral emissivity, an experimental apparatus for normal spectral emissivity measurement at different temperatures has been developed. The sample and blackbody are heated by the same heating system, which permits to measure spectral emissivity up to 1273K. The temperatures of the sample and blackbody are measured and controlled by an infrared radiation thermometer and PID controller. The signal detection is carried out by a silicon photo detector at 1.5 μm. The experimental results focus on the capability of the apparatus to perform emissivity measurements as a function of temperature at a fixed wavelength. Using this apparatus, the spectral emissivity of SUS304 is first measured at different temperatures. In order to validate the measurement capability of the apparatus for different sample, three kinds of steel samples which have different percentages of constituents were measured. The measurement uncertainty of the experimental apparatus is analyzed. The overall uncertainty of the apparatus estimated is about 5%.

Citation Download Citation

Kun Yu, Yufang Liu, Guangrui Jia, and Deheng Shi "An experimental apparatus for normal spectral emissivity measurement", Proc. SPIE 8197, 2011 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments, 81971C (5 December 2011); https://doi.org/10.1117/12.907003

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