Paper
15 February 2012 Aberration correction for improving the performance of a DMHL system
Author Affiliations +
Proceedings Volume 8253, MEMS Adaptive Optics VI; 82530O (2012) https://doi.org/10.1117/12.908984
Event: SPIE MOEMS-MEMS, 2012, San Francisco, California, United States
Abstract
Dynamic maskless holographic lithography (DMHL) is a new micro-manufacturing technique that has no moving parts. The laser light used for patterning is directed in all three dimensions with a hologram displayed on a liquid-crystal spatial light modulator (SLM). Optical aberrations, like spherical aberration due to refractive index mismatch between the photoresist and the immersion oil of the high-NA objective or astigmatism due to the deformations in the surface of the SLM, can degrade the performance of the system. Degraded performance includes a decrease in potential patterning volume and pattern fidelity and an increase in patterning time. This paper presents a way to correct for these aberrations using Zernike polynomials. The optimal Zernike coefficients are found by maximizing a sharpness metric. The effect of aberration correction on the DMHL process is quantified by measuring the patterning volume. DMHL manufactured features made with this aberration correction method show a marked improvement over features made without correction. It is even possible to correct for misaligned optics with this method.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Daniel R. McAdams and Daniel G. Cole "Aberration correction for improving the performance of a DMHL system", Proc. SPIE 8253, MEMS Adaptive Optics VI, 82530O (15 February 2012); https://doi.org/10.1117/12.908984
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KEYWORDS
Optical lithography

Aberration correction

Monochromatic aberrations

Spatial light modulators

Holograms

Zernike polynomials

Holography

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