Short Pulse X-Ray Diffraction Studies Of Shocked And Annealed Crystals Using The Janus Research Laser

R. W. Lee; M. J. Eckart; J. D. Kilkenny; R. R. Whitlock; A. Hauer; J. S. Wark

doi:10.1117/12.965044

4 February 1988 Short Pulse X-Ray Diffraction Studies Of Shocked And Annealed Crystals Using The Janus Research Laser

R. W. Lee, M. J. Eckart, J. D. Kilkenny, R. R. Whitlock, A. Hauer, J. S. Wark

Proceedings Volume 0831, X-Rays from Laser Plasmas; (1988) https://doi.org/10.1117/12.965044
Event: 31st Annual Technical Symposium on Optical and Optoelectronic Applied Sciences and Engineering, 1987, San Diego, CA, United States

Abstract

When a crystal is annealed or shocked the spacing of the interatomic planes is altered, and a measurement of the lattice spacing can yield information on the temperature or compression respectively. We have used the JANUS research laser at LLNL to perform such measurements of transiently strained crystals. JANUS is a two beam laser system, with separate synchronized oscillators for each beam. One beam of the laser, containing ~10 -100 J of 1.06pm light in a pulse of 1 ns FWHM, was focused to a 3.9 cm diameter spot on the surface of a silicon crystal; the crystal was either annealed or shock-compressed, depending on the absence or presence of a variety of thin coatings applied to the crystal surface. At some time during or after the perturbing pulse, the second synchronous but delayed laser beam, containing ~10 J of 0.53pm light in a pulse of 100 ps (FWHM), was focused to a 40pm diameter spot onto a separate target containing calcium, potassium, and chlorine. Thus, a short pulse of the helium-like line radiation of these atoms was produced, and this radiation was Bragg diffracted from the surface of the strained crystal. Measurements of the change in Bragg angle, caused by thermal expansion or shock compression, gives a direct measurement of one component of the strain within the crystal. A single laser shot gives recordable x-ray levels. A number of shots at different irradiances and delay times gave information about the lattice spacing as a function of time. The potential applications of such results is discussed.

Citation Download Citation

R. W. Lee, M. J. Eckart, J. D. Kilkenny, R. R. Whitlock, A. Hauer, and J. S. Wark "Short Pulse X-Ray Diffraction Studies Of Shocked And Annealed Crystals Using The Janus Research Laser", Proc. SPIE 0831, X-Rays from Laser Plasmas, (4 February 1988); https://doi.org/10.1117/12.965044

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $17.00

Non-members: $21.00 ADD TO CART

PROCEEDINGS
8 PAGES

DOWNLOAD PAPER SAVE TO MY LIBRARY

GET CITATION

RIGHTS & PERMISSIONS

Get copyright permission Get copyright permission on Copyright Marketplace

KEYWORDS

Crystals

Laser crystals

Aluminum

Diffraction

X-rays

Silicon

X-ray diffraction

Show All Keywords

Keywords/Phrases

Search In:

Publication Years