Design of the displacement platform for the life test system of the space infrared device

Xianliang Zhu; Xiangrong He; Haiyan Zhang; Lan Cao; Haimei Gong

doi:10.1117/12.975929

15 October 2012 Design of the displacement platform for the life test system of the space infrared device

Xianliang Zhu, Xiangrong He, Haiyan Zhang, Lan Cao, Haimei Gong

Proceedings Volume 8417, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; 841734 (2012) https://doi.org/10.1117/12.975929
Event: 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT 2012), 2012, Xiamen, China

Abstract

In the life test of space infrared detector, it was unable to periodically measure blackbody response signal of infrared detectors conveniently, due to equipment limitations for a long time. Accordingly, it was also unable to get abundant failure data of devices for statistical analysis. For this problem, we have designed a new multi-station structure, in which automatic test of signal can be carried out on life test site. The displacement platform is the key component to achieve automatic test. By theoretical analysis of parameters which affect response signal and actual test data analysis, we studied and designed the displacement platform, and put up indexes of displacement platform which meet the system requirements well. Indexes of the rotating stage are: repeat positioning accuracy <9.5×10-4° , radial run-out <10 um, face run-out <20 um. Indexes of the translation stage are: repeat positioning accuracy <10 um, straightness <10 um, flatness< 20 um. And the blackbody pitch angle should be controlled within less than 1°. This design well prepared for the development of automatic test system of infrared detector photoelectric properties.

Citation Download Citation

Xianliang Zhu, Xiangrong He, Haiyan Zhang, Lan Cao, and Haimei Gong "Design of the displacement platform for the life test system of the space infrared device", Proc. SPIE 8417, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 841734 (15 October 2012); https://doi.org/10.1117/12.975929

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KEYWORDS

Signal detection

Black bodies

Sensors

Infrared detectors

Infrared radiation

Statistical analysis

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