Mapping optical process in semiconductor nanowires using dynamic optical tweezers

Fan Wang; Wen Jun Toe; Alexander Harstone; Woei Ming Lee; David McGloin; Qiang Gao; Hark Hoe Tan; Chennupati Jagadish; Peter J. Reece

doi:10.1117/12.928558

10 October 2012 Mapping optical process in semiconductor nanowires using dynamic optical tweezers

Fan Wang, Wen Jun Toe, Alexander Harstone, Woei Ming Lee, David McGloin, Qiang Gao, Hark Hoe Tan, Chennupati Jagadish, Peter J. Reece

Author Affiliations +

Proceedings Volume 8458, Optical Trapping and Optical Micromanipulation IX; 845822 (2012) https://doi.org/10.1117/12.928558
Event: SPIE NanoScience + Engineering, 2012, San Diego, California, United States

Abstract

We present a novel method for spatial mapping of the luminescent properties of single optically trapped semiconductor nanowires by combing dynamic optical tweezers with micro-photoluminescence. The technique involves the use of a spatial light modulator (SLM) to control the axial position of the trapping focus relative to the excitation source and collection optics. When a nanowire is held in this arrangement, scanning the axial position of the trapping beam enables different sections of the nanowire axis to be probed. In this context we consider the axial resolution of the luminescence mapping and optimization of the nanowire trapping by spherical aberration correction.

Citation Download Citation

Fan Wang, Wen Jun Toe, Alexander Harstone, Woei Ming Lee, David McGloin, Qiang Gao, Hark Hoe Tan, Chennupati Jagadish, and Peter J. Reece "Mapping optical process in semiconductor nanowires using dynamic optical tweezers", Proc. SPIE 8458, Optical Trapping and Optical Micromanipulation IX, 845822 (10 October 2012); https://doi.org/10.1117/12.928558

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