The photon beam transport and diagnostics system at FERMI@Elettra, the Italian seeded FEL source: commissioning experience and most recent results

Marco Zangrando; Alessandro Abrami; Daniele Cocco; Claudio Fava; Simone Gerusina; Riccardo Gobessi; Nicola Mahne; Eric Mazzucco; Lorenzo Raimondi; Luca Rumiz; Cristian Svetina; Fulvio Parmigiani

doi:10.1117/12.929749

15 October 2012 The photon beam transport and diagnostics system at FERMI@Elettra, the Italian seeded FEL source: commissioning experience and most recent results

Marco Zangrando, Alessandro Abrami, Daniele Cocco, Claudio Fava, Simone Gerusina, Riccardo Gobessi, Nicola Mahne, Eric Mazzucco, Lorenzo Raimondi, Luca Rumiz, Cristian Svetina, Fulvio Parmigiani

Author Affiliations +

Proceedings Volume 8504, X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications; 850404 (2012) https://doi.org/10.1117/12.929749
Event: SPIE Optical Engineering + Applications, 2012, San Diego, California, United States

Abstract

FERMI@Elettra, the Italian Free Electron Laser (FEL) source, is in an advanced commissioning phase, having already delivered radiation down to the endstations. The facility is routinely using the low energy branch (FEL1) to produce photons in the 65–20 nm range, while the 20–4 nm range will be covered by FEL2 that is now being commissioned. A dedicated system to collect, diagnose, transport and focus the radiation (PADReS) is used to provide informations about the photon beam intensity, position, spectral content, transverse coherence, and so on. The experience gathered so far, as well as the most recent results both from the diagnostic section and the beam manipulation part are presented here.

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Marco Zangrando, Alessandro Abrami, Daniele Cocco, Claudio Fava, Simone Gerusina, Riccardo Gobessi, Nicola Mahne, Eric Mazzucco, Lorenzo Raimondi, Luca Rumiz, Cristian Svetina, and Fulvio Parmigiani "The photon beam transport and diagnostics system at FERMI@Elettra, the Italian seeded FEL source: commissioning experience and most recent results", Proc. SPIE 8504, X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications, 850404 (15 October 2012); https://doi.org/10.1117/12.929749

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