Paper
18 December 2012 Wideband and high-power light sources for in-line interferometric diagnostics of laser structuring systems
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Proceedings Volume 8697, 18th Czech-Polish-Slovak Optical Conference on Wave and Quantum Aspects of Contemporary Optics; 869718 (2012) https://doi.org/10.1117/12.2007388
Event: 18th Czech-Polish-Slovak Optical Conference on Wave and Quantum Aspects of Contemporary Optics, 2012, Ostravice, Czech Republic
Abstract
Laser structuring is rapidly developing manufacturing technique for broad spectrum of industrial branches, e.g. aerospace, power engineering, tool- and mould making, and automotive. It enables to prepare work pieces and products with very fine micro structures achieving a far better degree of details than conventional structuring techniques like etching or eroding. However, the state of art in laser structuring shows a crucial deficit. Used systems contain no metrology setup to detect the shape geometry (depth and length) and contour accuracy during the process. Therefore, an innovative in-line metrology technique based on low coherence interferometry for laser structuring systems has been investigated and described in the paper. In this contribution we present our results in the research of wideband and highpower light sources for the proposed low-coherence interferometric measurement system. The system can be incorporated into a structuring workplace equipped with a Q-switched ytterbium-doped fiber laser at 1064 nm for material processing. In the paper we focus on two wideband sources for such a measurement system. The first source is based on a superluminescent diode and the second one is based on an amplified spontaneous emission in a double-clad ytterbium-doped fiber. An example of results measured with the proposed in-line metrology system is presented.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Pavel Peterka, Filip Todorov, Ivan Kašίk, Vlastimil Matějec, Ondřej Podrazký, Ladislav Šašek, Guilherme Mallmann, and Robert Schmitt "Wideband and high-power light sources for in-line interferometric diagnostics of laser structuring systems ", Proc. SPIE 8697, 18th Czech-Polish-Slovak Optical Conference on Wave and Quantum Aspects of Contemporary Optics, 869718 (18 December 2012); https://doi.org/10.1117/12.2007388
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KEYWORDS
Superluminescent sources

Laser systems engineering

Metrology

Interferometry

Light sources

Optical isolators

Absorption

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