Paper
16 October 2013 Ammonia detection using optical reflectance from porous silicon formed by metal-assisted chemical etching
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Abstract
An impact of morphology on reflectance of porous silicon was investigated. Depending on the metal-assisted chemical etching conditions the macro- micro structures could be formed. The reflectance properties of various porous silicon structures after ammonia adsorption were investigated. It was shown that increasing of ammonia concentration in the measurement camber leads to an increase of the reflectance. The most sensitive structures for ammonia detection are porous silicon having approximately size of pores - 10-15 μm. A fast response of porous silicon on the adsorption of ammonia molecules may be used for development of new sensors.
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Igor Iatsunskyi, Valentyn Smyntyna, Mykolai Pavlenko, Olga Kanevska, Yuliia Kirik, and Valeryi Myndrul "Ammonia detection using optical reflectance from porous silicon formed by metal-assisted chemical etching", Proc. SPIE 8901, Optics and Photonics for Counterterrorism, Crime Fighting and Defence IX; and Optical Materials and Biomaterials in Security and Defence Systems Technology X, 89010K (16 October 2013); https://doi.org/10.1117/12.2028497
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Cited by 2 scholarly publications.
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KEYWORDS
Silicon

Reflectivity

Wet etching

Adsorption

Etching

Molecules

Atomic force microscopy

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