Paper
27 March 2014 Extending lithography with advanced materials
Author Affiliations +
Abstract
Material evolution has been a key enabler of lithography nodes in the last 30 years. This paper explores the evolution of anti-reflective coatings and their transformation from materials that provide only reflection control to advanced multifunctional layers. It is expected that complementary processes that do not require a change in wavelength will continue to dominate the development of new devices and technology nodes. New device architecture, immersion lithography, negative-tone development, multiple patterning, and directed self-assembly have demonstrated the capabilities of extending lithography nodes beyond what anyone thought would be possible. New material advancements for future technology nodes are proposed.
© (2014) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Douglas J. Guerrero "Extending lithography with advanced materials", Proc. SPIE 9051, Advances in Patterning Materials and Processes XXXI, 905114 (27 March 2014); https://doi.org/10.1117/12.2047302
Lens.org Logo
CITATIONS
Cited by 2 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Optical lithography

Lithography

System on a chip

Etching

Antireflective coatings

Extreme ultraviolet

Plasma etching

Back to Top