Optimal design of optical length in low turbidity measurement system with wavelength 1310 nm and 1550 nm

Hui-bin Cao; Jian-guo Liu; Hua-qiao Gui; Jie Wang; Huan-qin Wang

doi:10.1117/12.2071612

13 November 2014 Optimal design of optical length in low turbidity measurement system with wavelength 1310 nm and 1550 nm

Hui-bin Cao, Jian-guo Liu, Hua-qiao Gui, Jie Wang, Huan-qin Wang

Author Affiliations +

Proceedings Volume 9276, Optical Metrology and Inspection for Industrial Applications III; 92761P (2014) https://doi.org/10.1117/12.2071612
Event: SPIE/COS Photonics Asia, 2014, Beijing, China

Abstract

To meet the need of long distance transmission in low turbidity measurement system for low-loss, a new optical structure with wavelength 1310nm and 1550nm as the incident light is employed. In this research, experiments have been done for different optical length of the two wavelength light sources. The results show that: first, the transmitted light intensity has big difference under the circumstance of same concentration and optical length, though the loss has no remarkable difference transmitted in optical fiber between 1310nm and 1550nm. Second, the optimized optical length for better absorbance has been determined for 1310nm and 1550nm and it is irrelevant to the incident intensity. Third, the intensity of the two transmitted light decreases exponentially with the increase of optical length. For example, when the range of the optical length of 1310nm is 0.5mm-2mm, the transmitted intensity is about 60%-79% and the absorbance is 0.12-0.42. The transmitted intensity is about 5%-44%. When the range of the optical length of 1550nm is 0.5mm-2mm and the absorbance is still 0.12-0.42. Our experimental data provides the basis both for the optical length selection of these two light sources in water and the near-infrared spectral wavelength selection.

Citation Download Citation

Hui-bin Cao, Jian-guo Liu, Hua-qiao Gui, Jie Wang, and Huan-qin Wang "Optimal design of optical length in low turbidity measurement system with wavelength 1310 nm and 1550 nm", Proc. SPIE 9276, Optical Metrology and Inspection for Industrial Applications III, 92761P (13 November 2014); https://doi.org/10.1117/12.2071612

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