Reliability study of high-brightness multiple single emitter diode lasers

Jing Zhu; Thomas Yang; Cuipeng Zhang; Chao Lang; Xiaochen Jiang; Rui Liu; Yanyan Gao; Weirong Guo; Yuhua Jiang; Yang Liu; Luyan Zhang; Louisa Chen

doi:10.1117/12.2080434

13 March 2015 Reliability study of high-brightness multiple single emitter diode lasers

Jing Zhu, Thomas Yang, Cuipeng Zhang, Chao Lang, Xiaochen Jiang, Rui Liu, Yanyan Gao, Weirong Guo, Yuhua Jiang, Yang Liu, Luyan Zhang, Louisa Chen

Author Affiliations +

Proceedings Volume 9348, High-Power Diode Laser Technology and Applications XIII; 93480J (2015) https://doi.org/10.1117/12.2080434
Event: SPIE LASE, 2015, San Francisco, California, United States

Abstract

In this study，the chip bonding processes for various chips from various chip suppliers around the world have been optimized to achieve reliable chip on sub-mount for high performance. These chip on sub-mounts, for examples, includes three types of bonding, 8xx nm-1.2W/10.0W Indium bonded lasers, 9xx nm 10W-20W AuSn bonded lasers and 1470 nm 6W Indium bonded lasers will be reported below. The MTTF@25℃ of 9xx nm chip on sub-mount (COS) is calculated to be more than 203,896 hours. These chips from various chip suppliers are packaged into many multiple single emitter laser modules, using similar packaging techniques from 2 emitters per module to up to 7 emitters per module. A reliability study including aging test is performed on those multiple single emitter laser modules. With research team’s 12 years’ experienced packaging design and techniques, precise optical and fiber alignment processes and superior chip bonding capability, we have achieved a total MTTF exceeding 177,710 hours of life time with 60% confidence level for those multiple single emitter laser modules. Furthermore, a separated reliability study on wavelength stabilized laser modules have shown this wavelength stabilized module packaging process is reliable as well.

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Jing Zhu, Thomas Yang, Cuipeng Zhang, Chao Lang, Xiaochen Jiang, Rui Liu, Yanyan Gao, Weirong Guo, Yuhua Jiang, Yang Liu, Luyan Zhang, and Louisa Chen "Reliability study of high-brightness multiple single emitter diode lasers", Proc. SPIE 9348, High-Power Diode Laser Technology and Applications XIII, 93480J (13 March 2015); https://doi.org/10.1117/12.2080434

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