Fabrication error tolerant SOI WDM device using bidirectional angled multimode interferometers

Graham T. Reed; Youfang Hu; David J. Thomson; Ali Z. Khokhar; Stevan Stanković; Colin J. Mitchell; Frederic Y. Gardes; Goran Z. Mashanovich

doi:10.1117/12.2076824

27 February 2015 Fabrication error tolerant SOI WDM device using bidirectional angled multimode interferometers

Graham T. Reed, Youfang Hu, David J. Thomson, Ali Z. Khokhar, Stevan Stanković, Colin J. Mitchell, Frederic Y. Gardes, Goran Z. Mashanovich

Author Affiliations +

Proceedings Volume 9367, Silicon Photonics X; 936704 (2015) https://doi.org/10.1117/12.2076824
Event: SPIE OPTO, 2015, San Francisco, California, United States

Abstract

We have demonstrated a bidirectional wavelength division (de)multiplexer (WDM) on the silicon-on-insulator platform. An excellent match of the peak transmission wavelength of each channel between the two AMMIs was achieved. This type of device is ideal for integrated optical transceivers where the transmission wavelengths are required to match with the receiving wavelengths. The device also benefits from simple fabrication (as only a single lithography and etching step is required), improved convenience for the transceiver layout design, a reduction in tuning power and circuitry, and efficient use of layout space.

Citation Download Citation

Graham T. Reed, Youfang Hu, David J. Thomson, Ali Z. Khokhar, Stevan Stanković, Colin J. Mitchell, Frederic Y. Gardes, and Goran Z. Mashanovich "Fabrication error tolerant SOI WDM device using bidirectional angled multimode interferometers", Proc. SPIE 9367, Silicon Photonics X, 936704 (27 February 2015); https://doi.org/10.1117/12.2076824

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