Paper
19 May 2015 Experimental examination of ultraviolet Raman cross sections of chemical warfare agent simulants
F. Kullander, L. Landström, H. Lundén, Pär Wästerby
Author Affiliations +
Abstract
Laser induced Raman scattering from the commonly used chemical warfare agent simulants dimethyl sulfoxide, tributyl phosphate, triethyl phosphonoacetate was measured at excitation wavelengths ranging from 210 to 410 nm using a pulsed laser based spectrometer system with a probing distance of 1.4 m and with a field of view on the target of less than 1mm. For the purpose of comparison with well explored reference liquids the Raman scattering from simulants was measured in the form of an extended liquid surface layer on top of a silicon wafer. This way of measuring enabled direct comparison to the Raman scattering strength from cyclohexane. The reference Raman spectra were used to validate the signal strength of the simulants and the calibration of the experimental set up. Measured UV absorbance functions were used to calculate Raman cross sections. Established Raman cross sections of the simulants make it possible to use them as reference samples when measuring on chemical warfare agents in droplet form.
© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
F. Kullander, L. Landström, H. Lundén, and Pär Wästerby "Experimental examination of ultraviolet Raman cross sections of chemical warfare agent simulants", Proc. SPIE 9455, Chemical, Biological, Radiological, Nuclear, and Explosives (CBRNE) Sensing XVI, 94550S (19 May 2015); https://doi.org/10.1117/12.2176538
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Cited by 4 scholarly publications.
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KEYWORDS
Raman spectroscopy

Liquids

Silicon

Ultraviolet radiation

Absorption

Raman scattering

Semiconducting wafers

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